The pattern is fabricated using 15nm chromium over single crystal silicon
58 Cantilever Thickness (RNG): 0
Sharp nitride lever probes ideally suited for Peak Force Quantitative Nano-Electric measurements
There is a distribution of particle heights between 1 and 5nm
FastScan-A probes are designed specifically for imaging in air on the Dimension FastScan AFM
Ultrathin Carbon (<3nm) on Carbon Lacey Support Film Style:400 Mesh Copper The pattern is fabricated usingOVERVIEW PRODUCT SPECIFICATIONS Substrates, Support Films for Transmission Electron Microscopy Grids PELCO TEM grid Support Films of Formvar, Formvar Carbon, Carbon, and Silicon Monoxide are available on the following 3. 05mm O. D. grids: 0. 4 x 2mm single slot Cu, 75 mesh Cu, 200 mesh Cu,Ni or Au, 200 mesh Hex Mo, 300 mesh Cu, Ni or Au, 300 mesh Hex Mo, and 400 mesh Cu, Ni, Au, Al, Ti and stainless steel. Support films on the finer mesh grids can